X-ray detector
AEON
AEON is a next-generation photon-counting X-ray detector based on CERN-developed Timepix4 technology. Combining event-driven and frame-based acquisition modes, it delivers outstanding temporal resolution, high sensitivity, and the flexibility to address a wide range of scientific and industrial applications.
Timepix4 technology from CERN
The AEON detector system is a noise-free X-ray detector built around the Timepix4 readout chip developed within the Medipix collaboration. Designed for high-rate and time-resolved measurements, AEON combines fine spatial resolution, high sensitivity, and precise per-pixel timing information.
AEON operates in two distinct data acquisition modes: event-driven and frame-based. In event-driven mode, both the Time of Arrival (ToA) and Time-over-Threshold (ToT) are recorded for each detected photon. The detector generates a data packet only when a photon interacts with the sensor, significantly reducing data volume during low-dose exposures while providing superior temporal resolution.
In frame-based mode, the system accumulates photon counts over a user-defined exposure time. The counter depth can be configured as either 8-bit or 16-bit. With its 55 µm pixel pitch, flexible readout architecture, and nanosecond-scale timing capabilities, AEON enables experiments that require high throughput, precise event localisation, and detailed temporal information.
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Noise-free -
55 µm pixel size -
Nanosecond time resolution in event-driven mode -
On-chip sparsification -
Sensors for different X-ray energy ranges available -
Up to 40 000 kHz in full-frame mode
AEON 230k / 700k
X-ray detection with nanosecond time resolution
AEON features and variants
AEON combines a 55 µm pixel pitch with photon-counting performance and a modular detector architecture which allows large area sensors based on the 700k single module. In event-driven mode, it provides sub-10 ns temporal resolution across the full detector and a timing bin resolution of 195 ps, while generating data only when photons are detected. In frame-based mode, AEON supports continuous acquisition at up to 40 kHz without readout deadtime. Available with silicon, gallium arsenide, and cadmium telluride sensors, AEON covers X-ray energies from 6 keV to 150 keV and adapts to a wide range of experimental requirements.
Technical specifications
- Pixel size [µm²]
- 55 × 55
- Thresholds
- 1
- Noise
- Photon counting – noise free
Event-driven mode
- Data
- Spatial coordinates, ToT, ToA
- ToA resolution
- < ~10 ns (full detector)* / 195 ps (timing bin resolution)
- ToT energy resolution
- ~1 keV at 12 keV
- Readout
- Continuous data stream
- Maximum count rate (global)
- Up to 3.5 × 10⁵ hits/mm/s
- Minimum pixel processing time
- 400 ns + ToT
Frame-based mode
- Data
- Full frames
- Framerate
- Up to 40 kHz
- Readout
- Continous frames, no deadtime
- Dynamic range
- 8-bit and 16-bit
- Maximum count rate
- 5 × 10⁹ hits/mm/s
* Depending on sensor material and X-ray energy. Values measured with Si 300 µm and 12 keV.
Available sizes
230k |
700k |
2M |
7M |
|
|---|---|---|---|---|
| Pixel array [px²] | 448 x 512 | 1344 x 512 | 1344 x 1536 | 2688 x 2560 |
| Sensor area [mm²] | 25 x 28 | 74 x 28 | 74 x 92 | 150 x 156 |
| Dimensions (w x h x d) [mm³] | 90 x 49 x 240 | coming soon | ||
| Weight [kg] | 2.3 | coming soon | ||
All specifications are subject to change.
Event-driven mode
In frame-based mode, every image frame contains the values of all detector pixels, including pixels without any signal.
In event-driven mode, the detector records only pixels in which photons are actually detected. Instead of continuously transmitting complete image frames, AEON generates a stream of photon events containing the pixel coordinates, arrival time (ToA), and deposited energy information (ToT) for each photon.
This on-chip sparsification dramatically reduces data volume when only a small fraction of the detector is illuminated. At the same time, it preserves precise spatial and temporal information for every detected photon, enabling time-resolved measurements with nanosecond-scale resolution while providing spectroscopic capabilities through the recorded ToT information.
Control computer and software
All detector systems are delivered with a fully configured control computer running Debian Linux and preinstalled detector control software. Different hardware and software options are available depending on your requirements.
The control software provides a range of integration and operation options. X-Spectrum provides a C++ control library that can be integrated into common beamline control systems. Open-source TANGO and EPICS drivers, for example, have been developed by users. Python bindings are available for convenient scripted detector operation. In addition, an open-source GUI written in Python is provided for manual control and for gaining practical insight into how to use the library.
Sensor materials
AEON is available in four different sensor material configurations – silicon (300 μm and 500 μm thickness), gallium arsenide (500 μm), and cadmium telluride (1000 μm)– optimized for different X-ray energy ranges and applications.
| Si | Si | GaAs | CdTe | |
|---|---|---|---|---|
| Thickness | 300 μm | 500 μm | 500 μm | 1000 μm |
| Energy range | 6–20 keV | 6–25 keV | 8–75 keV | 8 – 150 keV |
| coming soon | coming soon |
Key contact
Get in touch!
From initial inquiries to long-term projects, we support customers around the world with expert advice and responsive service. Reach out to discuss your application, request a quote, or learn more about our detector technologies. Our experienced technical sales team is happy to assist.
