AMBER systems use Silicon as a sensor material. AMBER systems are sensitive to single electrons at 30 keV and above; below this, the protective Al layer on the sensor reduces the detection efficiency. However, sensors with a thinned entrance window for lower-energy electron detection will soon be available.
Control PC and software
All AMBER systems are sold with a control PC with software installed. Different PC options are available, depending on your requirements.
The control software provides a range of options. There is a control library written in C++ which can be integrated into common microscope control systems. This library also has a set of Python bindings. Finally, a GUI is provided for manual control.
To allow synchronisation with the microscope, there is an external trigger input which can be operated in a variety of modes. For example, this can be used to control when each image is taken, or be used as an electronic gate to switch the detector’s sensitivity on and off during image taking.
AMBER can be used for a wide range of TEM and STEM experiments. Its high speed and sensitivity make it particularly well suited to fast experiments or when working with radiation-sensitive samples, for example in electron diffraction or cryo-EM.